Latest news:
The leading online resource for Vacuum Coating, Plasma Processing, Thin Film Fabrication, and Nanotechnology



Hiden Ion Milling Probe – End Point Detector

Hiden Analytical Limited 

The only dedicated end point determination tool for ion etch control and optimum process quality. Applications Include: – End point Analysis- Target Impurity Determination- Quality Control / SPC- Residual Gas Analysis- Leak DetectionThe IMP is a differentially pumped, ruggedized secondary ion mass spectrometer for the analysis of secondary ions and [...]


EQP – Mass and Energy Analyser for Plasma Diagnostics

Hiden Analytical Limited 

Complete energy resolved mass speciation and mass resolved energy analysis of all species in your plasma:- Positive ions, Negative Ions, Neutral Radicals and Neutrals analysis.- Etching / Deposition Studies- Ion implantation / Laser Ablation- Residual Gas Analysis / Leak Detection- Plasma electrode coupling – follow electrode conditions during operation.- Analysis [...]


ESPion, an Advanced Langmuir Probe for Plasma Diagnostics

Hiden Analytical Limited 

The most advanced and reliable Langmuir Probe available for:- Etching / Deposition / Cleaning Plasma Processes- Pulsed plasma operation.- Ion collection (Ni & Gi)- Electron retardation (Te & EEDF)- Electron collection (Ne).- Plasma Potential.- Debye Length, floating potential- Ion fluxThe ESPion advanced Langmuir probe for rapid, reliable and accurate plasma [...]


Residual Gas Analysers for Vacuum Diagnostics and Leak Detection – RGA Series Quadrupole Mass Spectrometers

Hiden Analytical Limited 

Hiden RGA series quadrupole mass spectrometers for the examination of components present in a vessel or evolved from a process, featuring: – PPM Sensitivity, mass range to 300 amu, Remote (PC) or Local Control interface.- Stability (less than ±0.5% height variation over 24 h).- MASsoft control via RS232, USB or [...]


The Hiden HPR-30 Process Gas Analyser – for Vacuum Coating/Plasma Etching

Hiden Analytical Limited 

For the examination of all the components present in your chamber or evolved from your system:- CVD / PECVD / RIE / LPCVD / MOCVD- Vacuum Coating / Plasma Etching- Sputter Deposition- Contamination Studies- Base Pressure Fingerprint- Leak Detection / Virtual Leaks / desorption- Outgassing / Bakeout / Pump Performance- [...]


Log In

Remember Me
Or log-in using Your account on